XPS and SEM characterization of zirconia thin films prepared by electrochemical deposition
β Scribed by P. Stefanov; D. Stoychev; M. Stoycheva; J. Ikonomov; Ts. Marinova
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 365 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0142-2421
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Thin (x = 0-30 at.% ) alloy Γlms prepared by a reactive radio frequency (r.f.) sputtering (Co 0.8 Al 0.2 ) 100-x N x method were characterized by XPS and x-ray di β raction (XRD). The Γlm with no nitrogen consisted of a CsCltype CoAl metallic compound, while the nitrogen-containing alloys were c
## Abstract Polycarbazole (PCz) thin films have been synthesized by electrochemistry. The influence of the deposition technique, potentiostatic or potentiodynamic, on the properties of the PCz films has been studied using the deposition time and the potential maximum as parameters. The PCz films ha
Several Co-Al-O alloy thin films with different physical properties were prepared by reactive r.f. sputtering of Co 85 Al 15 and Co 70 Al 30 alloy targets in Ar Y O 2 atmospheres and were characterized by XPS, x-ray diffraction (XRD) and electron probe microanalysis (EPMA). The alloy films contained