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XPS and IR (ATR) analysis of Pd oxide films obtained by electrochemical methods

✍ Scribed by Josep M. Tura; Pere Regull; Lluís Victori; M. Dolors de Castellar

Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
237 KB
Volume
11
Category
Article
ISSN
0142-2421

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The composition and thickness of thin iron oxide Ðlms on polycrystalline pure iron were evaluated from Fe 2p spectra as measured by x-ray photoelectron spectroscopy. To this end the experimental spectra were reconstructed from reference spectra of the constituents Fe0, Fe2' and Fe3'. The background