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XPS and EELS study of the valence band electronic structure of TiN and (Ti, Al)N coatings as influenced by the deposition parameters

โœ Scribed by I.leR. Strydom; S. Hofmann


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
377 KB
Volume
41
Category
Article
ISSN
0042-207X

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