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XPS analysis on SiO2 sol-gel thin films

✍ Scribed by S. Santucci; S. Di Nardo; L. Lozzi; M. Passacantando; P. Picozzi

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 447 KB
Volume: 76
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(95)02419-0

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