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XES, XPS and NEXAFS Studies of the Electronic Structure of Cubic MoO1.9 and H1.63MoO3 Thick Films.

โœ Scribed by O. Yu. Khyzhun; T. Strunskus; Yu. M. Solonin


Publisher
John Wiley and Sons
Year
2004
Weight
54 KB
Volume
35
Category
Article
ISSN
0931-7597

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