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X-rays used to measure defect depths

✍ Scribed by GmbH Philips

Publisher
Elsevier Science
Year
1988
Weight
426 KB
Volume
21
Category
Article
ISSN
0308-9126

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Defect analysis in crystals using X-ray
Defect analysis in crystals using X-ray topography
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## Abstract A brief review of X‐ray topographyβ€”a nondestructive method for direct observation and characterization of defects in single crystalsβ€”is presented here. The origin and development of this characterization method and the different techniques derived from it are described. Emphasis is plac