X-ray two-crystal diffractometer for testing of plane analyser crystals
✍ Scribed by Dr. sc. L. Dressler; Dr. O. Wehrhan; I. Uhlig; R. Gütt
- Publisher
- John Wiley and Sons
- Year
- 1989
- Tongue
- English
- Weight
- 288 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0232-1300
No coin nor oath required. For personal study only.
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