The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering
✦ LIBER ✦
X-ray topography of complicated cross-section sapphire shaped crystals
✍ Scribed by I. L. Shul’pina; P. I. Antonov; S. I. Bakholdin; V. M. Krymov
- Publisher
- Italian Physical Society
- Year
- 1997
- Tongue
- English
- Weight
- 810 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0392-6737
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