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X-ray topographic investigation of dislocations in titanium single crystals grown by recrystallization

โœ Scribed by Jourdan, C. ;Gastaldi, J.

Publisher
John Wiley and Sons
Year
1977
Tongue
English
Weight
906 KB
Volume
43
Category
Article
ISSN
0031-8965

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Moscow Institnte oe Steel iind Alloys State research and project Institute of tho r&m-nirtale Industry Podolsk chemical and metalliirgical works ## X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb Heavily Sb dopcd silicon crystals grown by Czochralski mcthod were i