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X-ray studies of interfacial roughness in ZnSeGaAs heterostructures

✍ Scribed by A. Krol; C.J. Sher; S.C. Woronick; Y.H. Kao; R.J. Dalby; D.A. Cammack; R.N. Bhargava


Book ID
103917748
Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
201 KB
Volume
4
Category
Article
ISSN
0749-6036

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We discuss the theory of X-ray scattering from multilayers with conformal roughness of the interfaces, and illustrate with an analysis of specular, diffuse and wide-angle scattering from a GaAs/AIAs multilayer. This is a highly coherent multilayer structure deposited on a stepped, but otherwise smoo