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X-ray spectrometry and photoelectron spectroscopy applied to the study of layered samples: SiO2 and SiOx films on InSb

✍ Scribed by R. H. Packwood; G. Remond; P. H. Holloway


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
697 KB
Volume
11
Category
Article
ISSN
0142-2421

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