Erratum to “Infrared spectroscopy and X-ray diffraction studies on the crystallographic evolution of La2O3 films upon annealing” Microelectronic Engineering 85 (2008) 2411–2413

✍ Scribed by D. Tsoutsou; G. Scarel; A. Debernardi; S.C. Capelli; S.N. Volkos; L. Lamagna; S. Schamm; P.E. Coulon; M. Fanciulli

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 161 KB
• Volume: 86
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2008.12.062