## Abstract Polarized Raman spectroscopy was used to investigate the roomβtemperature phonon characteristics of a series of rareβearth arsenate (REAsO~4~, RE = Sm, Eu, Gd, Tb, Dy, Ho, Tm, Yb, and Lu) single crystals. The Raman data were interpreted in a systematic manner based on the known tetragon
β¦ LIBER β¦
X-Ray Single-Crystal Investigation of Rare Earth Osmium Silicides.
β Scribed by C. Rizzoli; P. S. Salamakha; O. L. Sologub; D. Belletti; A. P. Goncalves; M. Almeida
- Publisher
- John Wiley and Sons
- Year
- 2004
- Weight
- 56 KB
- Volume
- 35
- Category
- Article
- ISSN
- 0931-7597
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Raman investigations of rare-earth arsen
β
G. Barros; C. C. Santos; A. P. Ayala; I. Guedes; L. A. Boatner; C.-K. Loong
π
Article
π
2009
π
John Wiley and Sons
π
English
β 165 KB
X-Ray Single Crystal Investigation of th
β
C. Rizzoli; P. S. Salamakha; O. L. Sologub; O. V. Zaplatynsky
π
Article
π
2005
π
John Wiley and Sons
β 8 KB
π 2 views
X-ray investigations of friction stresse
β
M. Puff; Dr. rer. nat. W. Wuttke
π
Article
π
1980
π
John Wiley and Sons
π
English
β 254 KB
π 1 views
X-ray investigations of BaLaGa3O7 single
β
Dr. J. Przedmojski; B. Pura; W. Piekarczyk; M. Berkowski
π
Article
π
1984
π
John Wiley and Sons
π
English
β 242 KB
π 2 views
X-Ray Topographic Investigation of Silic
β
Prof. Dr. sc. S. S. Gorelik; Dr. V. T. Bublik; M. A. Khatsernov; Dr. I. N. Voron
π
Article
π
1972
π
John Wiley and Sons
π
English
β 620 KB
Moscow Institnte oe Steel iind Alloys State research and project Institute of tho r&m-nirtale Industry Podolsk chemical and metalliirgical works ## X-Ray Topographic Investigation of Silicon Single Crystals Heavily Doped with Sb Heavily Sb dopcd silicon crystals grown by Czochralski mcthod were i
Magnetic X-Ray Scattering and the Exampl
β
A. Schneidewind; A. Kreyssig; M. Loewenhaupt
π
Article
π
2005
π
John Wiley and Sons
β 8 KB