This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:<BR>thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and
X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research
β Scribed by Metin Tolan (auth.)
- Publisher
- Springer Berlin Heidelberg
- Year
- 1999
- Tongue
- English
- Leaves
- 195
- Series
- Springer Tracts in Modern Physics 148
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Table of Contents
Introduction....Pages 1-4
Reflectivity of x-rays from surfaces....Pages 5-31
Reflectivity experiments....Pages 33-73
Advanced analysis techniques....Pages 75-89
Statistical description of interfaces....Pages 91-112
Off-specular scattering....Pages 113-149
X-ray scattering with coherent radiation....Pages 151-168
Closing remarks....Pages 169-169
β¦ Subjects
Surfaces and Interfaces, Thin Films; Soft Matter, Complex Fluids; Solid State Physics and Spectroscopy
π SIMILAR VOLUMES
<p><p>Applications of X-ray scattering to soft matter have advanced considerably within recent years, both conceptually and technically β mature high-power X-ray sources, synchrotrons and rotating anodes, as well as high-speed detectors have become readily available. High-quality time-resolved exper
<p><p>Applications of X-ray scattering to soft matter have advanced considerably within recent years, both conceptually and technically β mature high-power X-ray sources, synchrotrons and rotating anodes, as well as high-speed detectors have become readily available. High-quality time-resolved exper
<p><p>Applications of X-ray scattering to soft matter have advanced considerably within recent years, both conceptually and technically β mature high-power X-ray sources, synchrotrons and rotating anodes, as well as high-speed detectors have become readily available. High-quality time-resolved exper
With contributions by Paul F. Fewster and Christoph GenzelWhile X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thi
While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, b