✦ LIBER ✦

X-ray reflectivity and AFM studies of polystyrene-CdS nanocomposite thin films

✍ Scribed by M Mukherjee; Neelima Deshmukh; S.K Kulkarni

Book ID: 108418154
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 219 KB
Volume: 218
Category: Article
ISSN: 0169-4332
DOI: 10.1016/s0169-4332(03)00625-1

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

X-ray reflectivity study of thin film ox

X-ray reflectivity study of thin film oxide superconductors

✍ S.-W. Han; J.A. Pitney; P.F. Miceli; M. Covington; L.H. Greene; M.J. Godbole; D. 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 217 KB

Electroluminescence, photoluminescence a

Electroluminescence, photoluminescence and x-ray reflectivity studies of self-assembled ultra-thin films

✍ Haiping Hong; Prof. Dan Davidov; Haim Chayet; Prof. Yair Avny; Erez Z. Faraggi; 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 458 KB 👁 1 views

EPR and X-ray investigations of CdS thin

EPR and X-ray investigations of CdS thin films

✍ Dr. B. Dogil; Dr. M. Lepek 📂 Article 📅 1985 🏛 John Wiley and Sons 🌐 English ⚖ 202 KB

Optical and X-ray studies of low resisti

Optical and X-ray studies of low resistivity CdS films

✍ A. K. S. Aqili; Z. Ali; A. Maqsood; I. A. Qazi; A. Ul. Haq; M. Ahmad; M. Abbas 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 50 KB

Energy-dispersive X-ray reflectivity and

Energy-dispersive X-ray reflectivity and GID for real-time growth studies of pentacene thin films

✍ S. Kowarik; A. Gerlach; W. Leitenberger; J. Hu; G. Witte; C. Wöll; U. Pietsch; F 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 553 KB

C–AFM and X–TEM : Studies of Mixed-Phase

C–AFM and X–TEM : Studies of Mixed-Phase Silicon Thin Films

✍ Tomáš Mates; Antonín Fejfar; Bohuslav Rezek; Jan Kočka; Paula C. P. Bronsveld; J 📂 Article 📅 2008 🏛 Wiley (John Wiley & Sons) ⚖ 570 KB

Thin intrinsic silicon films containing microcrystalline grains embedded in amorphous tissue were studied by two complementary microscopy techniques. The conductive atomic force microscopy was performed in standard ambient conditions with very sensitive (pA) current detection. The cross-sectional tr