𝔖 Bobbio Scriptorium
✦   LIBER   ✦

X-ray photoelectron spectroscopy (XPS) studies of clean and hydrated TiO2 (rutile) surfaces

✍ Scribed by T.K. Sham; M.S. Lazarus


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
610 KB
Volume
68
Category
Article
ISSN
0009-2614

No coin nor oath required. For personal study only.

✦ Synopsis


Using XPS, we have detected severaI oxygen sites on the surface of hydrated TiOz (rutite) crystals. These sites are attributed to chemisorbed and phbsisorbed HzO. XPS spectra of clean TiOz resulting from scrapins in vacuum indicate that oxygens terminate at the very surface. Imptications of these observations are discussed_ I_ introduction It is commomy recognized that metal oxide surfaces, such as those of TiO, , AI,O, , Sn02, and 2110


πŸ“œ SIMILAR VOLUMES


Angle-resolved x-ray photoelectron spect
✍ Paynter, R. W. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 294 KB πŸ‘ 2 views

Coupons of polished aluminium, glass and polystyrene were exposed to radiofrequency (r.f.) plasmas containing helium, nitrogen and oxygen. Angle-resolved XPS measurements of the treated surfaces were made immediately, after a few days and after about 9 months. The data were interpreted in terms of a

Salt or co-crystal? determination of pro
✍ Joanna S. Stevens; Stephen J. Byard; Sven L.M. Schroeder πŸ“‚ Article πŸ“… 2010 πŸ› John Wiley and Sons 🌐 English βš– 180 KB

Combined 15 N ssNMR and X-ray photoelectron spectroscopy (XPS) investigations for theophylline, a theophylline co-crystal, and a theophyllinium salt demonstrate that XPS allows direct observation of the degree of proton transfer, and thus identification of whether a salt or a co-crystal has been for

Effect of Hydration of Polyamide Membran
✍ M.J. Ariza; J. Benavente; E. RodrΔ±́guez-CastellΓ³n; L. Palacio πŸ“‚ Article πŸ“… 2002 πŸ› Elsevier Science 🌐 English βš– 252 KB

The surface and the solid/liquid interface of two polyamide membranes, one experimental (B0) and one commercial (NF45), have been characterized by X-ray photoelectronic spectroscopy (XPS), atomic force microscopy (AFM), and zeta potential, respectively. The surface roughness, determined by AFM data