X-ray photoelectron spectroscopy investigation of segregation processes at Sb and In doped SnO2
β Scribed by D. Dobler; S. Oswald; J. Werner; W. Arabczyk; G. Behr; K. Wetzig
- Book ID
- 118578899
- Publisher
- Elsevier Science
- Year
- 2003
- Tongue
- English
- Weight
- 268 KB
- Volume
- 286
- Category
- Article
- ISSN
- 0301-0104
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Nanocrystalline Ga In Sb particles embedded in SiO matrix were grown by radio frequency RF magnetron 0.62 0.38 2 Ε½ . Ε½ . co-sputtering. X-ray diffraction XRD patterns and X-ray photoelectron spectroscopy XPS strongly support the existence of separated nanocrystalline Ga In Sb material in a SiO matri