X-ray photoelectron spectroscopy and magnetic force microscopy studies of ion-beam deposited Ni80Fe20/Co-oxide bilayers

✍ Scribed by Ko-Wei Lin; Fu-Tai Lin; Yi-Min Tzeng

• Book ID: 114649932
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 341 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2004.842125