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Rutherford backscattering and X-ray photoelectron spectroscopy studies of dual ion beam deposited zirconium oxide films

โœ Scribed by Tang, Y. S. ;Castle, J. E. ;Liu, H. ;Watts, J. F. ;Huang, N. K.


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
252 KB
Volume
121
Category
Article
ISSN
0031-8965

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