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X-ray photoelectron spectroscopy and conducting atomic force microscopy investigations on dual ion beam sputtered MgO ultrathin films

✍ Scribed by Braj Bhusan Singh; Vikash Agrawal; Amish G. Joshi; Sujeet Chaudhary

Book ID: 116943639
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 786 KB
Volume: 520
Category: Article
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2012.06.078

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