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Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

✍ Scribed by Ou Gu-ping; Gui Wen-ming; Jin Shi-chao; Zhang Fu-jia

Book ID: 103817357
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 711 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2005.01.042

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