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Characterization of the surface film on Zr-based bulk metallic glass using X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM)

✍ Scribed by Ming Tan; Qiao Liu; Nian Zhang; Huiqin Hu; Biao Li; Xianjie Kang

Book ID: 116608385
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 751 KB
Volume: 509
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2011.03.051

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