X-ray photoelectron diffraction investigation of the cleavage plane in -transition metal dichalcogenides

✍ Scribed by D. Stoltz; S.E. Stoltz

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 435 KB
• Volume: 398
• Category: Article
• ISSN: 0921-4526
• DOI: 10.1016/j.physb.2007.05.014

✦ Synopsis

We present a detailed study of the three members of the 1T-transition metal dichalcogenides: TiSe 2 , TaSe 2 and TaS 2 by means of the X-ray photoelectron diffraction combined with single-scattering simulations. Our simulations of different surface terminations and their comparison with the measured diffraction patterns allow to determine that the cleavage occurs within the van der Waals gap. Singlescattering calculations are shown to simulate very well the measured diffractograms on these compounds.