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Application of convergent beam electron diffraction to study the stacking of layers in transition-metal dichalcogenides

✍ Scribed by K.K. Fung; J.W. Steeds; J.A. Eades

Publisher: Elsevier Science
Year: 1980
Weight: 824 KB
Volume: 99
Category: Article
ISSN: 0378-4363
DOI: 10.1016/0378-4363(80)90208-9

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