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X-ray photoelectron and auger spectroscopy analysis of Ge:Mn-based magnetic semiconductor layers

✍ Scribed by E. S. Demidov; S. Yu. Zubkov; V. P. Lesnikov; G. A. Maksimov; D. E. Nikolichev; V. V. Podol’skii

No coin nor oath required. For personal study only.

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