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X-ray optics for emission line X-ray source diffraction enhanced systems

✍ Scribed by D. Chapman; I. Nesch; M.O. Hasnah; T.I. Morrison

Book ID: 108219641
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 431 KB
Volume: 562
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2006.02.185

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