X-ray line profile analysis—An ideal tool to quantify structural parameters of nanomaterials

✍ Scribed by Michael B. Kerber; Michael J. Zehetbauer; Erhard Schafler; Florian C. Spieckermann; Sigrid Bernstorff; Tamas Ungar

• Book ID: 107524640
• Publisher: The Minerals, Metals & Materials Society
• Year: 2011
• Tongue: English
• Weight: 1008 KB
• Volume: 63
• Category: Article
• ISSN: 1047-4838
• DOI: 10.1007/s11837-011-0115-1