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X-ray line profile analysis studies on SnSe thin films deposited at different substrate temperatures

✍ Scribed by T.Subba Rao; B.K.Samanata Ray; A.K. Chaudhuri

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 307 KB
Volume: 165
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(88)90697-9

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