X-ray fluorescence method for determining the mass absorption coefficient in two-layer thin-film Ti/Ge and Ni/Ge systems

✍ Scribed by N. I. Mashin, R. V. Lebedeva, A. N. Tumanova, A. A. Ershov

• Book ID: 113068187
• Publisher: Springer US
• Year: 2012
• Tongue: English
• Weight: 144 KB
• Volume: 79
• Category: Article
• ISSN: 0021-9037
• DOI: 10.1007/s10812-012-9599-x