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An X-ray fluorescence method for determining the mass absorption coefficient in thin-film V/Ge and Cr/Ge bilayer systems

โœ Scribed by Mashin, N. I.; Chernyaeva, E. A.; Tumanova, A. N.; Ershov, A. A.


Book ID
121639271
Publisher
SP MAIK Nauka/Interperiodica
Year
2013
Tongue
English
Weight
204 KB
Volume
49
Category
Article
ISSN
0020-1685

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