With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t
โฆ LIBER โฆ
X-ray film has high resolution and sensitivity
โ Scribed by DuPont (UK) Ltd
- Publisher
- Elsevier Science
- Year
- 1988
- Weight
- 103 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0308-9126
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