✦ LIBER ✦

X-ray diffraction using combined film and microprocessor techniques

✍ Scribed by Samuelsen, E. J.

Book ID: 114500037
Publisher: International Union of Crystallography
Year: 1987
Tongue: English
Weight: 707 KB
Volume: 20
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s0021889887086953

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Stress measurement by X–ray diffraction

Stress measurement by X–ray diffraction using film techniques

✍ K. W. ANDREWS; J. C. GREGORY; D. BROOKSBANK 📂 Article 📅 1974 🏛 John Wiley and Sons 🌐 English ⚖ 545 KB

Study of oxide precipitates in silicon u

Study of oxide precipitates in silicon using X-ray diffraction techniques

✍ Caha, Ondřej ;Bernatová, Silvie ;Meduňa, Mojmír ;Svoboda, Milan ;Buršík, Jiří 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 294 KB

## Abstract The results of a study of oxide precipitates in Czochralski (CZ) grown silicon using two X‐ray diffraction methods are reported. The diffuse scattering around the Bragg diffraction maxima was measured on a series of samples after various two‐stage annealing treatment. Combining the anal

Using thin-film X-ray diffraction to stu

Using thin-film X-ray diffraction to study ion implanted metal

✍ Yan Pengxun 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 373 KB

Processing of X-ray diffraction imaging

Processing of X-ray diffraction imaging data using remote sensing techniques

✍ T. Wroblewski; E. Wild; T. Poeste; A. Pyzalla 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 978 KB

The crystallography of CA1−xFx using X-r

The crystallography of CA1−xFx using X-ray powder diffraction techniques

✍ F. Guirado; S. Galí; J.S. Chinchón 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 333 KB

Quantification of olanzapine polymorphs

Quantification of olanzapine polymorphs using powder X-ray diffraction technique

✍ Manisha Tiwari; Garima Chawla; Arvind K. Bansal 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 693 KB