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X-ray diffraction study of the effect of hydrogen atoms on the Si–Si atomic short-range order in amorphous silicon

✍ Scribed by Mosseri, R. ;Sella, C. ;Dixmier, J.

Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
365 KB
Volume
52
Category
Article
ISSN
0031-8965

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