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X-ray diffraction study of the composition and strain fields in buried SiGe islands

✍ Scribed by N. Hrauda; J. J. Zhang; M. Stoffel; J. Stangl; G. Bauer; A. Rehman-Khan; V. Holý; O. G. Schmidt; V. Jovanovic; L. K. Nanver

Book ID: 111633716
Publisher: Springer-Verlag
Year: 2009
Tongue: English
Weight: 863 KB
Volume: 167
Category: Article
ISSN: 1951-6355
DOI: 10.1140/epjst/e2009-00934-7

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