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X-ray diffraction study of the bonding between sulphur and the elements of group IVB. The crystal and molecular structures of methylthiotriphenyl-methane, -silicon, -germanium, -tin and -lead

✍ Scribed by G.D. Andreetti; G. Bocelli; G. Calestani; P. Sgarabotto


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
820 KB
Volume
273
Category
Article
ISSN
0022-328X

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