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X-ray diffraction study of Ge-Bi-Te mixed-layer ternary compounds

✍ Scribed by O. G. Karpinskii; L. E. Shelimova; M. A. Kretova; V. S. Zemskov

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

ChemInform Abstract: X-Ray Diffraction S

✍ O. G. Karpinskii; L. E. Shelimova; M. A. Kretova; V. S. Zemskov 📂 Article 📅 2001 🏛 John Wiley and Sons ⚖ 31 KB 👁 2 views

X-ray Diffraction Study of Mixed-Layer C

✍ O. G. Karpinskii; L. E. Shelimova; E. S. Avilov; M. A. Kretova; V. S. Zemskov 📂 Article 📅 2002 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 73 KB

X-ray Diffraction Study of Mixed-Layer C

✍ O. G. Karpinskii; L. E. Shelimova; M. A. Kretova; E. S. Avilov; V. S. Zemskov 📂 Article 📅 2003 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 61 KB

X-ray diffraction study of ternary layer

✍ L. E. Shelimova; O. G. Karpinskii; V. S. Zemskov 📂 Article 📅 2008 🏛 SP MAIK Nauka/Interperiodica 🌐 English ⚖ 186 KB

Physico-chemical study of Ge(Pb)Te-Bi2(S

✍ A.S. Skoropanov; B.L. Valevsky; V.F. Skums; G.I. Samal; A.A. Vecher 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 205 KB

X-ray study and electrical properties of

✍ Karpinskii, O. G. ;Shelimova, L. E. ;Kretova, M. A. ;Avilov, E. C. 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 411 KB