𝔖 Bobbio Scriptorium
✦   LIBER   ✦

ChemInform Abstract: X-Ray Diffraction Study of Ge—Bi—Te Mixed-Layer Ternary Compounds.

✍ Scribed by O. G. Karpinskii; L. E. Shelimova; M. A. Kretova; V. S. Zemskov

Publisher
John Wiley and Sons
Year
2001
Weight
31 KB
Volume
32
Category
Article
ISSN
0931-7597

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

ChemInform Abstract: Electron Microscopy
ChemInform Abstract: Electron Microscopy and X-Ray Diffraction Study on the Structure of TaReSe4 Layer Crystals.
✍ V. V. VOLKOV; V. S. PERVOV; E. V. MAKHONINA; I. L. EREMENKO 📂 Article 📅 2010 🏛 John Wiley and Sons ⚖ 29 KB 👁 2 views

1998 structure structure (solids and liquids) D 2000 ## 35 -002 Electron Microscopy and X-Ray Diffraction Study on the Structure of TaReSe 4 Layer Crystals. -The structure of layered crystals of the title selenide, obtained by solid-phase vacuum synthesis, is formulated more precisely based on el

ChemInform Abstract: X-Ray Diffraction,
ChemInform Abstract: X-Ray Diffraction, 119Sn Moessbauer and Thermal Study of SnSe—Bi2Se3 System.
✍ K. Adouby; M. L. Elidrissi Moubtassim; C. P. Vicente; J. C. Jumas; A. A. Toure 📂 Article 📅 2008 🏛 John Wiley and Sons ⚖ 12 KB 👁 1 views

## Abstract ChemInform is a weekly Abstracting Service, delivering concise information at a glance that was extracted from about 200 leading journals. To access a ChemInform Abstract of an article which was published elsewhere, please select a “Full Text” option. The original article is trackable v