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X-ray diffraction study of corrugated semiconductor surfaces, quantum wires and quantum ☐es

✍ Scribed by L. Tapfer; G.C. La Rocca; H. Lage; O. Brandt; D. Heitmann; K. Ploog


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
249 KB
Volume
60-61
Category
Article
ISSN
0169-4332

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