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X-ray diffraction study of a one-dimensional GaAs–AlAs superlattice

✍ Scribed by Segmüller, A. ;Krishna, P. ;Esaki, L.


Book ID
114498635
Publisher
International Union of Crystallography
Year
1977
Tongue
English
Weight
654 KB
Volume
10
Category
Article
ISSN
0021-8898

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## Abstract The width of the interface between sublayers in a GaAs/AIAs superlattice was investigated using AES combined with Ar^+^ ion sputtering and chemical etching. The factors stipulating the experimental broadening of the interface width were estimated. The real interface width, determined fo