Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th
X-ray diffraction studies in resins: Effect of entanglements and chain structure
โ Scribed by S. Swarup; A. N. Nigam
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 260 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0021-8995
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โฆ Synopsis
Synopsis
X-ray diffraction halo of alkyd, amino, and epoxy resins were recorded. The effective d obtained from them was used to estimate certain physical parameters like cross-sectional area, number of carbon atoms per chain, and stiffness parameters from the empirical curves of Boyer and Miller. Amino resin was found to behave differently than the rest of the resins which have a benzene ring in their backbone. These ideas find a confirmation from the ultrasonic and dielectric measurements performed on these very samples.
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