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X-ray-diffraction measurements from imperfect GaAs crystals: Evidence for near-surface defects

✍ Scribed by Bloch, R.; Bahr, D.; Olde, J.; Brügemann, L.; Press, W.

Book ID: 118020237
Publisher: The American Physical Society
Year: 1990
Tongue: English
Weight: 419 KB
Volume: 42
Category: Article
ISSN: 1098-0121
DOI: 10.1103/physrevb.42.5093

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