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Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers

✍ Scribed by Bo Qu; Xinhe Zheng; Yutian Wang; Zhihong Feng; Jingyi Han; Shi’an Liu; Shiming Lin; Hui Yang; Junwu Liang


Publisher
SP Science China Press
Year
2001
Tongue
English
Weight
407 KB
Volume
44
Category
Article
ISSN
1674-7283

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