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X-ray diffraction line profile analysis of nanocrystalline graphite

✍ Scribed by Adriyan Milev; Michael Wilson; G.S. Kamali Kannangara; Nguyen Tran


Book ID
113782622
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
588 KB
Volume
111
Category
Article
ISSN
0254-0584

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The x-ray diffraction line profiles of the 002 reflections of graphite samples ground in a ball mill for periods up to 90 hours were studied using newly developed peak analysis methods that permitted separation of overlapping peaks having different peak positions, intensities, and line-breadths. For