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Characterization of nanocrystalline materials by X-ray line profile analysis

✍ Scribed by Tamás Ungár

Book ID: 106391920
Publisher: Springer
Year: 2006
Tongue: English
Weight: 361 KB
Volume: 42
Category: Article
ISSN: 0022-2461
DOI: 10.1007/s10853-006-0696-1

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