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X-ray diffraction by random layers: ideal line profiles and determination of structure amplitudes from observed line profiles

✍ Scribed by Wilson, A. J. C.

Book ID: 114515400
Publisher: International Union of Crystallography
Year: 1949
Tongue: English
Weight: 774 KB
Volume: 2
Category: Article
ISSN: 0365-110X
DOI: 10.1107/s0365110x49000631

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