Study of layer disorder and microstructural parameters of molybdenumtungsten mixed sulpho-selenide Mo0.5W0.5SxSe2-x(0 ⩽x⩽ 2) by X-ray line profile analysis

✍ Scribed by D. Palit; S. K. Srivastava; M. C. Chakravorti; B. K. Samantaray

• Publisher: Springer
• Year: 1996
• Tongue: English
• Weight: 192 KB
• Volume: 15
• Category: Article
• ISSN: 0261-8028
• DOI: 10.1007/bf00278112