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X-ray Diffraction Based Residual Stress Measurements for

โœ Scribed by Baldev Raj; T. Jayakumar; S. Mahadevan; Sanjay K. Rai


Book ID
106422323
Publisher
Springer-Verlag
Year
2009
Tongue
English
Weight
406 KB
Volume
28
Category
Article
ISSN
0195-9298

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