X-ray diffraction at elevated temperatures: a method for in situ processing analysis by D. D. L. Chung, P. W. DeHaven, H. Arnold and D. Ghosh

✍ Scribed by Finger, L. W.

• Book ID: 114500829
• Publisher: International Union of Crystallography
• Year: 1994
• Tongue: English
• Weight: 256 KB
• Volume: 27
• Category: Article
• ISSN: 0021-8898
• DOI: 10.1107/s0021889893013809