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X-ray diffraction analysis of epitaxal film distortions on miscut substrates (001)

✍ Scribed by A. V. Kolesnikov; A. S. Ilin; E. M. Trukhanov; A. P. Vasilenko; I. D. Loshkarev; A. S. Deryabin

No coin nor oath required. For personal study only.

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