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Tetragonal distortion of InAsPSb film grown on InAs substrate studied by Rutherford backscattering/channeling and synchrotron X-ray diffraction

✍ Scribed by F. Cheng; Tao Fa; Shude Yao; Chen-Jun Wu; Hao-Hsiung Lin; Zhe Chuan Feng


Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
405 KB
Volume
406
Category
Article
ISSN
0921-4526

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